Unified Embedding and Metric Learning for Zero-Exemplar Event Detection

Hussein, N.; Gavves, E.; Smeulders, A. W. M.

Unified Embedding and Metric Learning for Zero-Exemplar Event Detection
N. Hussein, E. Gavves, A. W. M. Smeulders
In IEEE Conference on Computer Vision and Pattern Recognition 2017.
[bibtex] [pdf] [url]

Bibtex Entry

@InProceedings{HusseinCVPR2017,
  author       = "N. Hussein and E. Gavves and A. W. M. Smeulders",
  title        = "Unified Embedding and Metric Learning for Zero-Exemplar Event Detection",
  booktitle    = "IEEE Conference on Computer Vision and Pattern Recognition",
  year         = "2017",
  url          = "https://ivi.fnwi.uva.nl/isis/publications/2017/HusseinCVPR2017",
  pdf          = "https://ivi.fnwi.uva.nl/isis/publications/2017/HusseinCVPR2017/HusseinCVPR2017.pdf"
}