Robust Autofocusing in Microscopy J. M. Geusebroek, F. Cornelissen, A. W. M. Smeulders, H. Geerts In Cytometry 2000. [bibtex] [pdf] [url]

A critical step in automatic microscopy is focusing. This report describes a robust and fast autofocus approach useful for a wide range of microscopic modalities and preparations. The focus curve is measured over the complete focal range, reducing the chance that the best focus position is determined by dust or optical artifacts. Convolution with the derivative of a Gaussian smoothing function reduces the effect of noise on the focus curve. The influence of mechanical tolerance is accounted for. The method is shown to be robust in fluorescence, bright-field and phase contrast microscopy, in fixed and living cells, as well as in fixed tissue. The algorithm was able to focus accurately within 2 or 3 seconds, even under extremely noisy and low contrast imaging conditions. The proposed method is generally applicable in light microscopy, whenever the image information content is sufficient. The reliability of the autofocus method allows for unattended operation on a large scale.



Patent:
J.M. Geusebroek, Robust autofocus system for a microscope, EP1190271 filed May 30, 2000, WO0075709 published December 14, 2000, US10/009,790 filed December 4, 2001.

@Article{GeusebroekCytometry2000,
  author       = "Geusebroek, J. M. and Cornelissen, F. and Smeulders, A. W. M. and Geerts, H.",
  title        = "Robust Autofocusing in Microscopy",
  journal      = "Cytometry",
  number       = "1",
  volume       = "39",
  pages        = "1--9",
  year         = "2000",
  url          = "https://ivi.fnwi.uva.nl/isis/publications/2000/GeusebroekCytometry2000",
  pdf          = "https://ivi.fnwi.uva.nl/isis/publications/2000/GeusebroekCytometry2000/GeusebroekCytometry2000.pdf",
  has_image    = 1
}